Global microwave surface emissivity error analysis
Author(s): Jones, A. S., P. C. Shott, J. M. Forsythe, C. L. Combs, R. W. Kessler, M. J. Nielsen, P. J. Stephens, T. H. Vonder Haar
Year: 2005
Type of Publication: Conference Proceeding
Convention: BACIMO
Conference Location: Monterey, CA
Conference Date: October 12-14