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Global microwave surface emissivity error analysis


Author(s): Jones, A. S., P. C. Shott, J. M. Forsythe, C. L. Combs, R. W. Kessler, M. J. Nielsen, P. J. Stephens, T. H. Vonder Haar

Year: 2005

Type of Publication: Conference Proceeding

Convention: BACIMO

Conference Location: Monterey, CA

Conference Date: October 12-14